CHAPTER 15 - Secondary Ion Mass Spectrometry

CHAPTER 15 - Secondary Ion Mass Spectrometry

Source :

• New Developments in Mass Spectrometry [ 2045-7545 ]

Descripteurs français

• Wicri :
  • topic : Sciences de la terre, Géochimie, Sciences de la vie, Optique, Spectrométrie, Oligoélément.

English descriptors

• KwdEn :
  • Aberration, Academic press, Acceleration lens, Active surface, Airlock, Airlock chamber, Anal, Analyser, Analysis chamber, Analyte, Analytical chamber, Analytical conditions, Analytical geochemistry, Analytical uncertainties, Appl, Atom probe, Atomic constituents, Atomic ions, Basic principle, Beam, Beam angle, Beam conditions, Beam intensity, Bernard boyer, Calibration method, Cameca, Cameca courtesy, Castaing, Castaing electron probe, Cell biology, Cellular substructures, Cesium, Cesium source, Chambost, Channel plate, Characterisation, Charge compensation, Chem, Chemical composition, Column ground, Commissariat atomique, Common practice, Compact instruments, Concentration ratio, Conf, Contrast aperture, Cosmochemistry, Critical illumination, Crossover, Crystal orientation, Depth profiles, Depth resolution, Detection limit, Detection limits, Direct imaging, Duoplasmatron, Duoplasmatron axis, Duoplasmatron source, Dynamic sims, Earth planet, Earth sciences, Electron microprobe, Electron multiplier, Electron multipliers, Electronegative elements, Electrostatic lenses, Electrostatic sector, Emission crossover, Energetic ions, Energy agency, Energy dispersion, Energy slit, Entrance slit, Environmental sampling, Environmental toxicants, Equilibrium regime, Equilibrium state, Exact assessment, Exact location, Exit beam, Exit slit, External standards, Extraction, Extraction electrode, Extraction field, Faraday cups, Favourable cases, Field aperture, Figure chapter, Figure schematics, Fission products, Fluorescent screen, Focal plane, Fresh sample, Full transmission, Geochemistry, Geol, Geophysics corp, Hall probe, Herzog, High count rate, High depth resolution, High mass resolution, High sensitivity, High transmission, Higher range, Imaging, Imaging mass spectrometry, Imma, Immersion lens, Impact energies, Impact energy, Implantation, Incidence angle, Incoming ions, Instrumental mass fractionation, Interface anal, Interference contribution, Ion, Ionisation, Ionisation rate, Ionisation rates, Isotope, Isotope ratio measurements, Isotopic, Isotopic abundances, Isotopic analysis, Isotopic composition, Isotopic mapping, Isotopic microanalysis, John wiley sons, Kinetic energy, Kohler aperture, Kohler illumination, Large number, Lateral resolution, Lens, Liebl, Life sciences, Light elements, Magnet, Magnet supply, Magnetic field, Magnetic sector, Magnetic sector sims, Magnetic sims, Main limitation, Major constituents, Major element, Many geochemical investigations, Mass analyser, Mass dispersion, Mass resolution, Mass spectrom, Mass spectrometer, Mass spectrometry, Mass spectrometry figure, Mass spectrometry sims, Massresolution power, Mater, Material science, Material sciences, Materials science, Matrix, Mckeegan, Methods phys, Microanalysis, Microchannel plate, Microchannel plate device, Micrometre scale, Microprobe, Microprobe mode, Minimise, Mollenstedt converter, Monoatomic ions, Multicollector system, Multiplier, Nanosims, Nanosims instrument, Negative ions, Normal electron, Nucl, Nuclear reactions, Nuclear safeguards, Nucleic acids, Ondrej hanousek, Optics, Other techniques, Oxide layer, Oxygen bombardment, Oxygen ions, Oxygen isotopes, Oxygen source, Particle analysis, Pasquet, Periodic table, Personalised medicine, Phys, Polyatomic ions, Positive ionisation, Positive ions, Potential matrix, Primary beam, Primary column, Primary columns, Primary ions, Primitive meteorites, Proc, Quadrupole, Quadrupole lens, Quantification, Quantitative subcellular, Real ground, Real image, Reference materials, Reference sample, Resistance microscopy, Resistive anode encoder, Royal society, Rsfs, Same voltage, Sample chamber, Sample chemical composition, Sample composition, Sample constituent, Sample holder, Sample introduction, Sample plane, Sample properties, Sample surface, Sample voltage, Sample volume, Schuhmacher, Secondary, Secondary beam, Secondary emission, Secondary ionisation, Secondary ions, Secondary polarities, Sector field sims instruments, Sector instruments, Semiconductor cleanrooms, Shallow junctions, Shrimp, Signal ratio, Signal ratios, Sims, Sims analysis, Sims applications, Sims community, Sims depth profiles, Sims instrument, Sims instruments, Sims literature, Sims measurements, Sims profile, Sims technique, Simultaneous measurement, Single cells, Slit, Slodzian, Solar system, Source chamber, Source projection column, Spatial resolution, Special attention, Special note, Specimen chamber, Spectrometer, Spectrometry, Sputtering, Square area, Static sims, Subcellular structures, Successive sample layers, Surf, Surface roughness, Tandem accelerator, Thomas prohaska, Trace element, Trace elements, Trace level, Trajectory, Transfer optics, Transfer settings, Translational modes, Ultra, Ultrashallow junctions, Uranium isotopes, Vacuum conditions, Wiedenbeck, Wien filter.
• Teeft :
  • Aberration, Academic press, Acceleration lens, Active surface, Airlock, Airlock chamber, Anal, Analyser, Analysis chamber, Analyte, Analytical chamber, Analytical conditions, Analytical geochemistry, Analytical uncertainties, Appl, Atom probe, Atomic constituents, Atomic ions, Basic principle, Beam, Beam angle, Beam conditions, Beam intensity, Bernard boyer, Calibration method, Cameca, Cameca courtesy, Castaing, Castaing electron probe, Cell biology, Cellular substructures, Cesium, Cesium source, Chambost, Channel plate, Characterisation, Charge compensation, Chem, Chemical composition, Column ground, Commissariat atomique, Common practice, Compact instruments, Concentration ratio, Conf, Contrast aperture, Cosmochemistry, Critical illumination, Crossover, Crystal orientation, Depth profiles, Depth resolution, Detection limit, Detection limits, Direct imaging, Duoplasmatron, Duoplasmatron axis, Duoplasmatron source, Dynamic sims, Earth planet, Earth sciences, Electron microprobe, Electron multiplier, Electron multipliers, Electronegative elements, Electrostatic lenses, Electrostatic sector, Emission crossover, Energetic ions, Energy agency, Energy dispersion, Energy slit, Entrance slit, Environmental sampling, Environmental toxicants, Equilibrium regime, Equilibrium state, Exact assessment, Exact location, Exit beam, Exit slit, External standards, Extraction, Extraction electrode, Extraction field, Faraday cups, Favourable cases, Field aperture, Figure chapter, Figure schematics, Fission products, Fluorescent screen, Focal plane, Fresh sample, Full transmission, Geochemistry, Geol, Geophysics corp, Hall probe, Herzog, High count rate, High depth resolution, High mass resolution, High sensitivity, High transmission, Higher range, Imaging, Imaging mass spectrometry, Imma, Immersion lens, Impact energies, Impact energy, Implantation, Incidence angle, Incoming ions, Instrumental mass fractionation, Interface anal, Interference contribution, Ion, Ionisation, Ionisation rate, Ionisation rates, Isotope, Isotope ratio measurements, Isotopic, Isotopic abundances, Isotopic analysis, Isotopic composition, Isotopic mapping, Isotopic microanalysis, John wiley sons, Kinetic energy, Kohler aperture, Kohler illumination, Large number, Lateral resolution, Lens, Liebl, Life sciences, Light elements, Magnet, Magnet supply, Magnetic field, Magnetic sector, Magnetic sector sims, Magnetic sims, Main limitation, Major constituents, Major element, Many geochemical investigations, Mass analyser, Mass dispersion, Mass resolution, Mass spectrom, Mass spectrometer, Mass spectrometry, Mass spectrometry figure, Mass spectrometry sims, Massresolution power, Mater, Material science, Material sciences, Materials science, Matrix, Mckeegan, Methods phys, Microanalysis, Microchannel plate, Microchannel plate device, Micrometre scale, Microprobe, Microprobe mode, Minimise, Mollenstedt converter, Monoatomic ions, Multicollector system, Multiplier, Nanosims, Nanosims instrument, Negative ions, Normal electron, Nucl, Nuclear reactions, Nuclear safeguards, Nucleic acids, Ondrej hanousek, Optics, Other techniques, Oxide layer, Oxygen bombardment, Oxygen ions, Oxygen isotopes, Oxygen source, Particle analysis, Pasquet, Periodic table, Personalised medicine, Phys, Polyatomic ions, Positive ionisation, Positive ions, Potential matrix, Primary beam, Primary column, Primary columns, Primary ions, Primitive meteorites, Proc, Quadrupole, Quadrupole lens, Quantification, Quantitative subcellular, Real ground, Real image, Reference materials, Reference sample, Resistance microscopy, Resistive anode encoder, Royal society, Rsfs, Same voltage, Sample chamber, Sample chemical composition, Sample composition, Sample constituent, Sample holder, Sample introduction, Sample plane, Sample properties, Sample surface, Sample voltage, Sample volume, Schuhmacher, Secondary, Secondary beam, Secondary emission, Secondary ionisation, Secondary ions, Secondary polarities, Sector field sims instruments, Sector instruments, Semiconductor cleanrooms, Shallow junctions, Shrimp, Signal ratio, Signal ratios, Sims, Sims analysis, Sims applications, Sims community, Sims depth profiles, Sims instrument, Sims instruments, Sims literature, Sims measurements, Sims profile, Sims technique, Simultaneous measurement, Single cells, Slit, Slodzian, Solar system, Source chamber, Source projection column, Spatial resolution, Special attention, Special note, Specimen chamber, Spectrometer, Spectrometry, Sputtering, Square area, Static sims, Subcellular structures, Successive sample layers, Surf, Surface roughness, Tandem accelerator, Thomas prohaska, Trace element, Trace elements, Trace level, Trajectory, Transfer optics, Transfer settings, Translational modes, Ultra, Ultrashallow junctions, Uranium isotopes, Vacuum conditions, Wiedenbeck, Wien filter.

Abstract

• https://api.istex.fr/document/A6402BCD978386AB30F6C0F8FA87741D9CC04546/fulltext/pdf

Affiliations:

• Allemagne, France

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